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curriculum/challenges/chinese/10-coding-interview-prep/project-euler/problem-307-chip-defects.md
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---
id: 5900f4a01000cf542c50ffb2
title: 问题307：芯片缺陷
title: 'Problem 307: Chip Defects'
challengeType: 5
videoUrl: ''
forumTopicId: 301961
dashedName: problem-307-chip-defects
---
# --description--
k个缺陷随机分布在一家工厂生产的n个集成电路芯片中（在芯片上可以发现任何数量的缺陷，每个缺陷与其他缺陷无关）。
k defects are randomly distributed amongst n integrated-circuit chips produced by a factory (any number of defects may be found on a chip and each defect is independent of the other defects).
令p（k，n）表示存在至少3个缺陷的芯片的概率。 例如p（3.7）≈0.0204081633。
Let p(k,n) represent the probability that there is a chip with at least 3 defects. For instance p(3,7) ≈ 0.0204081633.
找到p（20,000，1 000 000）并以0.abcdefghij的形式将答案四舍五入到小数点后10位。
Find p(20 000, 1 000 000) and give your answer rounded to 10 decimal places in the form 0.abcdefghij
# --hints--
`euler307()`应该返回0.7311720251。
`euler307()` should return 0.7311720251.
```js
assert.strictEqual(euler307(), 0.7311720251);