freeCodeCamp/problem-307-chip-defects.chinese.md at d7cd3f7777778067a931ac2dad7aedb5aa406b3e

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Kristofer Koishigawa b3213fc892 fix(i18n): chinese test suite (#38220 )

* fix: Chinese test suite

Add localeTiltes, descriptions, and adjust test text and testStrings to get the automated test suite working.

* fix: ran script, updated testStrings and solutions

2020-03-03 18:49:47 +05:30

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id, challengeType, title, videoUrl, localeTitle

id	challengeType	title	videoUrl	localeTitle
5900f4a01000cf542c50ffb2	5	Problem 307: Chip Defects		问题307：芯片缺陷

Description

k个缺陷随机分布在一家工厂生产的n个集成电路芯片中（在芯片上可以发现任何数量的缺陷，每个缺陷与其他缺陷无关）。

令p（k，n）表示存在至少3个缺陷的芯片的概率。例如p（3.7）≈0.0204081633。

找到p（20,000，1 000 000）并以0.abcdefghij的形式将答案四舍五入到小数点后10位。

Instructions

Tests

tests:
  - text: <code>euler307()</code>应该返回0.7311720251。
    testString: assert.strictEqual(euler307(), 0.7311720251);

Challenge Seed

function euler307() {
  // Good luck!
  return true;
}

euler307();

Solution

// solution required

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